It is becoming clear that functional testing of integrated circuits, the most widely used and oldest method in the semiconductor industry has reached the limits of its effectiveness. Functional Test ...
Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
Test engineers often are challenged with the task of simulating the environment in which the unit under test (UUT) will operate. To implement such a test, engineers use hot mock-up, embedded software, ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...
As chipmakers move towards finer geometries, IC designs are obviously becoming more complex and expensive. Given the enormous risks involved, chipmakers must ensure the quality of the parts before ...
Modern digital cameras and cell phones containing digital cameras are merely complex microprocessor systems with ever-increasing amounts of functionality. This increased functionality is spread out ...
Many books cover functional testing techniques, but relatively few also cover technical testing. “The Software Test Engineer’s Handbook, 2nd Edition” (US$49.95, 560 pages) from O’Reilly fills that gap ...
HOUSTON, March 21, 2025 (GLOBE NEWSWIRE) -- Baylor Genetics, a clinical diagnostic laboratory celebrating a decade at the forefront of genetic testing, today shared research on the value of both ...
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